ZEISS has introduced its latest innovation in the field of 3D X-ray microscopy: the ZEISS VersaXRM 730. This state-of-the-art system offers breakthrough resolution performance, an intuitive user experience, and faster throughput and time-to-results, all of which enhance productivity and expand research horizons. With system intelligence and pratical AI, VersaXRM 730 enables the study of an unprecedented range of samples for users of all skill levels, unlocking new application capabilities like never before. Get to know the power of VersaXRM 730 and elevate your research to new heights.

The Technology
Push the limits with unparalleled resolution performance of 500 nm from 30-160 kV. Achieve a rapid turn-around with one-minute tomographies. Rely on Versa's Resolution at a Distance (RaaD) for diverse sample types. And rest-easy with a system built on the proven Versa platform, a hallmark of ZEISS engineering and quality.

The Award-Winning Software
Unleash the full potential of X-ray microscopy with advanced algorithms and state-of-the-art technologies for faster scan times, improved image quality, enhanced contrast, accurate quantitative analysis, and the ability for all users to solve complex imaging challenges with intelligent guidance and streamlined workflows.

Expand your possibilities. Learn more by downloading the product flyer here.