Tactile, optical or X-ray: Three focus days are waiting for you, each tailored to the respective measurement technology. The fourth day adresses technology-independent topics, e. g. reporting and reverse engineering. In various sessions, we will present the highlights from our entire software portfolio for these technologies.

The sessions “What`s New in...” will show you all the new features in the respective software. Ask all your questions in the live Q&A sessions.

Software hacks: In this new format, our experts will show you tips and tricks to work even more efficiently with our products.

eLearnings present individual innovations in depth and are available on demand.

Further information can be found here.

Topic Overview

Tactile metrology - Tuesday, November 7
We will start with a focus on tactile metrology. Do you measure with coordinate measurement machines? Then you will certainly be interested in all the new functions of ZEISS CALYPSO. We will show you all relevant innovations to work even more efficiently.

Optical 3D metrology - Wednesday, November 8
On this day, it’s all about optical 3D metrology and ZEISS INSPECT as the central software product. No matter in which industry you are working: If you measure optically, you should not miss this day. You will learn all the news for the inspection of optical 3D data and in further sessions about special use cases such as the inspection of airfoils and blades or moving image data.

X-ray inspection - Thursday, November 9
If you already use X-ray technology, you are surely aware of its numerous metrological advantages. Find out why ZEISS INSPECT in particular is the key to evaluating CT data. Injection molded parts and castings have very specific requirements. We will show you which new and innovative options ZEISS INSPECT offers you to meet them.

Data management and reporting - Friday, November 10
The last focus day revolves around our overarching software products. We will show you how to establish comprehensive reporting and data management across all technologies with ZEISS PiWeb. In further sessions, you will learn how we can support you with microscopy or reverse engineering.

Register here.